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Testing & Screening

  • Component Testing and Screening
  • Qualification Test (Method 5005, Group A-D)
  • Sub-Assembly and System Level Test
  • Dynamic Test and Simulation
  • ESS/Powered Temp Cycle
  • DPA and Failure Analysis
  • Parts Management Services
  • Discrete Component Testing of all Technologies
  • Linear IC Testing
  • Digital IC Testing
  • Mechanical Qualification
  • Environmental Qualification
  • Radiation Tolerance Verification
  • Dynamic Burn-In
  • Static Burn-In
  • System Level Test Capabilities
  • Environmental Test/Failure Analysis
  • Electrical Test Capabilities
  • Mechanical Test Capabilities
  • Burn-In/Life Test Capabilities

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